The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2009
Filed:
Sep. 16, 2005
Koshi Maeda, Hitachinaka, JP;
Shinichi Fukuzono, Hitachinaka, JP;
Kokichi Sugano, Urayasu, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Tochigi Prefectural Office, Utsunomiya-shi, Tochigi, JP;
Abstract
There is provided a method of detecting or analyzing nucleic acid with a high reliability and reproducibility, capable of sampling target nucleic acid from initial target nucleic acid having not less than two types of sequences different from each other in a ratio which is proportional to that of initial target nucleic acid. A method of detecting or analyzing nucleic acid by sampling target nucleic acid from not less than two types of target nucleic acid samples having base sequences different in at least one base, and subjecting the sampled nucleic acid sample to detection or analysis; comprising steps of: obtaining the number of copies of initial target nucleic acid from the concentration of a nucleic acid in an initial target nucleic acid sample; and sampling the target nucleic acid of a predetermined number or more of copies from the initial target nucleic acid sample.