The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2009
Filed:
Feb. 07, 2007
Bahadir Tunaboylu, Chandler, AZ (US);
Guy B. Frick, Maple Glen, PA (US);
Edward L. Malantonio, Conshohocken, PA (US);
Horst Clauberg, Warminster, PA (US);
John Mcglory, Chandler, AZ (US);
Bahadir Tunaboylu, Chandler, AZ (US);
Guy B. Frick, Maple Glen, PA (US);
Edward L. Malantonio, Conshohocken, PA (US);
Horst Clauberg, Warminster, PA (US);
John McGlory, Chandler, AZ (US);
SV Probe Pte. Ltd., Singapore, SG;
Abstract
A method and apparatus for performing automated alignment of probes of a probe card is provided. The desired horizontal location for a probe is compared with the actual horizontal position for the probe to determine a horizontal correction distance and a horizontal correction direction to correct a horizontal alignment for the probe. A first tool automatically corrects the horizontal alignment for the probe based on the horizontal correction distance and the horizontal correction direction. Upon determining that an actual vertical position of the probe is closer to the probe card than a desired vertical position, a second tool automatically changes the actual vertical position of the probe to the desired vertical position. Upon determining that the actual vertical position of the probe is farther from the probe card than the desired vertical position, a third tool automatically changes the actual vertical position of the probe to the desired vertical position.