The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2009

Filed:

Jan. 22, 2008
Applicants:

Yong Sun Kim, Suwon-si, KR;

Hyo Chul Yun, Namyangju-si, KR;

Dae Gon Yun, Gumi-si, KR;

Inventors:

Yong Sun Kim, Suwon-si, KR;

Hyo Chul Yun, Namyangju-si, KR;

Dae Gon Yun, Gumi-si, KR;

Assignee:

Mirae Corporation, Chungcheongnam-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor chip test handler includes a first chamber in which packaged chips contained in a test tray are heated to high temperature or cooled to low temperature, a second chamber in which the packaged chips contained in the test tray are tested, and a third chamber in which the packaged chips contained in the test tray are cooled or heated to room temperature. The test trays are horizontally and/or vertically moved in an upright position between the first, second, and third chambers. The chambers may be arranged in a row or in a column. The test trays include a frame and a plurality of carriers into which the packaged chips are loaded. Connecting member and or projections are detachably mounted on lateral sides of the frame. A moving apparatus for moving the test trays between the first, second, and third chambers uses the connecting members and projections to push or pull the test trays into and out of the chambers.


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