The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
Jan. 05, 2007
Applicants:
Volker Seyfried, Nussloch, DE;
Frank Schreiber, Dossenheim, DE;
Inventors:
Volker Seyfried, Nussloch, DE;
Frank Schreiber, Dossenheim, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G12B 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus, a microscope having an apparatus, and a method for calibration of a photosensor chip () are disclosed. The apparatus has a photosensor chip () which has a multiplicity of light-sensitive elements. A reference light source () is provided and directs the light at at least one part of the photosensor chip (). In addition, an open-loop or closed-loop control unit () is provided and determines and corrects variances between the individual light-sensitive elements.