The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2009

Filed:

Sep. 30, 2002
Applicants:

Yun-sook Chae, Suwon, KR;

Ji-soo Kim, Yongin, KR;

Chang-jin Kang, Suwon, KR;

Inventors:

Yun-Sook Chae, Suwon, KR;

Ji-Soo Kim, Yongin, KR;

Chang-jin Kang, Suwon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, method and product of dry-etching a semiconductor device are disclosed, the system having a material supply for forming a material layer on the semiconductor substrate, a pattern for disposing at least one photoresist pattern on the material layer, a dry-etching chamber for housing a dry-etching process of the material layer, a chiller for adjusting the temperature of the chamber, the semiconductor substrate, the material layer and/or the photoresist for the dry-etching process, a stage for loading the semiconductor substrate in the dry-etching chamber, and a dry-etchant supply for dry-etching the material layer while the integrity of the photoresist pattern is enhanced by the adjusted temperature.


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