The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2009
Filed:
Mar. 19, 2008
Mehrab S. Sedeh, Beaverton, OR (US);
Mehrab S. Sedeh, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with each processor being connected to its own memory controller. Each memory controller is connected to its own memory. The processors are connected in a circular arrangement by multiple high-speed interconnects. There are multiple bridges with each processor being connected to its own bridge. There are multiple system buses with each bridge been connected to its own system bus. A housing encloses the processors, memory controllers, high-speed interconnects, and bridges.