The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2009
Filed:
Jun. 30, 2006
Applicants:
Zino Altman, Newtown, PA (US);
Daniel R. Neal, Tijeras, NM (US);
Richard James Copland, Albuquerque, NM (US);
Inventors:
Zino Altman, Newtown, PA (US);
Daniel R. Neal, Tijeras, NM (US);
Richard James Copland, Albuquerque, NM (US);
Assignee:
Amo Wavefront Sciences, LLC., Santa Ana, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method of measuring the curvature of a surface of a object operate by illuminating the object surface with a light pattern having a known size to produce a virtual reflected image from the object surface; measuring a size of the virtual reflected image produced by the object surface from the light pattern; and calculating a curvature of the object surface from the known size of the light pattern and the size of the virtual reflected image.