The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2009

Filed:

Jul. 03, 2002
Applicants:

Barry D. Van Veen, McFarland, WI (US);

Susan C. Hagness, Madison, WI (US);

Essex Julian Bond, Madison, WI (US);

Xu LI, Madison, WI (US);

Inventors:

Barry D. Van Veen, McFarland, WI (US);

Susan C. Hagness, Madison, WI (US);

Essex Julian Bond, Madison, WI (US);

Xu Li, Madison, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

Microwave imaging via space-time beamforming is carried out by transmitting microwave signals from multiple antenna locations into an individual to be examined and receiving the backscattered microwave signals at multiple antenna locations to provide received signals from the antennas. The received signals are processed in a computer to remove the skin interface reflection component of the signal at each antenna to provide corrected signal data. The corrected signal data is provided to a beamformer process that time shifts the received signals to align the returns from a scatterer at a candidate location, and then passes the time aligned signals through a bank of filters, the outputs of which are summed, time-gated and the power therein calculated to produce the beamformer output signal at a candidate location. The beamformer is then scanned to a plurality of different locations in the individual by changing the time shifts, filter weights and time-gating of the beamformer process. The output power may be displayed as a function of scan location, with regions of large output power corresponding to significant microwave scatterers such as malignant lesions.


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