The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2009
Filed:
Jul. 22, 2004
Kiyotaka Ichiyama, Tokyo, JP;
Masahiro Ishida, Tokyo, JP;
Takahiro Yamaguchi, Tokyo, JP;
Mani Soma, Seattle, WA (US);
Kiyotaka Ichiyama, Tokyo, JP;
Masahiro Ishida, Tokyo, JP;
Takahiro Yamaguchi, Tokyo, JP;
Mani Soma, Seattle, WA (US);
Advantest Corporation, Tokyo, JP;
Abstract
A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.