Bipolar-transistor and method for the production of a bipolar-transistor

Abstract

The invention relates to NPN and PNP bipolar transistors and to a method for the production thereof, said transistors being characterised by a particularly high collector-emitter and collector-base blocking voltage. The blocking voltage is increased by a particular doping profile. An NPN bipolar transistor comprises a p-doped substrate (), a trenched n-doped layer () forming the collector, a p-doped layer () which is arranged above the trenched n-doped layer and is made of a base and an n-doped layer which is arranged within the p-doped layer and forms an emitter of the transistor. A spatial charge area (RLZ) is formed between the p-doped layer and the trenched n-doped layer and a second spatial charge area (RLZ) is formed between the trenched n-doped layer and the p-doped substrate, which expands in the vertical direction on the collector when the transistor is operated with an increasing potential. The trenched n-doped layer comprises a doping profile in such a manner that when the transistor is operated with an increasing potential, the first and the second spatial charge area expand on the collector, transversing the entire depth of the trenched n-doped layer prior to the critical field strength for a breakthrough being reached between the collector and emitter.