The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Jan. 18, 2006
Wiley Zane Reed, Greenville, SC (US);
Bobby R. Cosper, Trenton, GA (US);
Kenneth G. Schmidt, Piedmont, SC (US);
Neil D. Bultz, Greenville, SC (US);
Charles E. Wickersham, Columbus, OH (US);
John P. Matera, Grove City, OH (US);
Wiley Zane Reed, Greenville, SC (US);
Bobby R. Cosper, Trenton, GA (US);
Kenneth G. Schmidt, Piedmont, SC (US);
Neil D. Bultz, Greenville, SC (US);
Charles E. Wickersham, Columbus, OH (US);
John P. Matera, Grove City, OH (US);
Tosoh SMD, Inc., Grove City, MO (US);
Abstract
A system and method are provided for manufacturing workpieces, such as metal articles like sputtering target, the system comprising: comparing one or more physical or chemical values of a respective one of a plurality of metal target blanks to one or more comparable values of at least one desired criterion; selecting one of the metal target blanks from a plurality of metal target blanks as a work-in-progress; assigning a serial route for the work-in-progress; processing the work-in-progress by translating the work-in-progress from note to node with an automated transport, after completion of the events at each node; rejecting or accepting the work-in-progress as a metal target by evaluating a result of at least one event of the one or more respective events to be completed at, at least one of the plurality of nodes.