The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Mar. 12, 2002
Hideo Naoki, Sakai, JP;
Terumi Nakajima, Shinjuku-ku, JP;
Yasufumi Ohfune, Takatsuki, JP;
Tetsuro Shinada, Sakai, JP;
Kazuya Murata, Otokuni-gun, JP;
Hideo Naoki, Sakai, JP;
Terumi Nakajima, Shinjuku-ku, JP;
Yasufumi Ohfune, Takatsuki, JP;
Tetsuro Shinada, Sakai, JP;
Kazuya Murata, Otokuni-gun, JP;
Suntory Holdings Limited, Osaka-shi, JP;
Abstract
A method for effectively causing charge-remote fragmentation (CRF) when the structural analysis of an nitrogen-containing organic compound is performed using a high-energy collisional-induced dissociation-mass/mass spectrum (CID-MS/MS spectrum), a reagent to be used in such a method, and a method for analyzing an organic compound by the induction of CRF are provided. The method for the induction of charge-remote fragmentation (CRF) using a high-energy collisional-induced dissociation-mass/mass spectrum (CID-MS/MS spectrum) has the step of: introducing a squaric acid residue into an end of a nitrogen-containing organic compound. The squaric acid residue is represented by a chemical formula (I): The reagent is provided for introducing such a squaric acid residue. Furthermore, the method is provided for analyzing such an organic compound by the induction of CRF.