The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2009
Filed:
May. 29, 2007
Wei-yi Xiao, Poughkeepsie, NY (US);
Dean Gilbert Bair, Bloomington, NY (US);
Thomas Ruane, Poughkeepsie, NY (US);
William Lewis, Poughkeepsie, NY (US);
Wei-Yi Xiao, Poughkeepsie, NY (US);
Dean Gilbert Bair, Bloomington, NY (US);
Thomas Ruane, Poughkeepsie, NY (US);
William Lewis, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A microprocessor simulation method, system, and program product, which are built upon the underlying hardware design of the microprocessor, stop normal functions of a simulation testcase, start the scan clocks, and record a first 'snap shot' of the scan ring data at an initial time. The hardware logic then rotates (shifts) the scan ring using the current scan data, and when the scan clock stops (where the stop of the scan clock is controlled based on the number of latches on the scan ring), another 'snap shot' of scan ring data is taken. The “snap shots” are compared and if both of the “snap shots” are identical the functional scan is successful. But if the functional scan verification fails to rotate the scan chain correctly, that is, if some of the latches do not match in the two “snap shots,” it becomes necessary to locate the broken spot within the large number of scan latches.