The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2009

Filed:

May. 21, 2004
Applicants:

E. Todd Ryan, Wappingers Falls, NY (US);

John A. Iacoponi, Wappingers Falls, NY (US);

Inventors:

E. Todd Ryan, Wappingers Falls, NY (US);

John A. Iacoponi, Wappingers Falls, NY (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/4763 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method of exposing low-k dielectric films to microwave radiation to cure the dielectric films. Microwave curing reduces the cure-time necessary to achieve the desired mechanical properties in the low-k films, thus decreasing the thermal exposure time for the NiSi transistor contacts. A lower thermal budget for interconnect fabrication is necessary to prevent damage to the NiSi transistor contacts and minimize thermal stressing of previously formed interconnect layers. Microwave-cured dielectric films also have higher mechanical strength and strong adhesion to overlying layers deposited during subsequent semiconductor device manufacturing steps.


Find Patent Forward Citations

Loading…