The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2009

Filed:

May. 26, 2006
Applicant:

Akira Nara, Tokyo, JP;

Inventor:

Akira Nara, Tokyo, JP;

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01); H04B 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

Time variation of phase noise characteristics is displayed for measurement. A peak power of a signal under test is detected to define the frequency as a reference frequency. An offset frequency from the reference frequency is repetitively changed and each time the phase noise power is integrated for a predetermined frequency width to evaluate an integration value. The integration values are divided by the predetermined frequency width. The divided values are further divided by the peak power to evaluate noise power ratios relative to the peak power. Then, relationship between the offset frequencies, noise characteristic values and time is displayed in a graph that shows the time variation of the phase noise characteristics.


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