The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2009

Filed:

Dec. 02, 2005
Applicants:

Adam J. Wright, Saratoga, CA (US);

Daniel Reilly, Mountain View, CA (US);

Yoke Mooi Lee, Penang, MY;

Inventors:

Adam J. Wright, Saratoga, CA (US);

Daniel Reilly, Mountain View, CA (US);

Yoke Mooi Lee, Penang, MY;

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tool for testing an integrated circuit is provided. The tool includes a vector execution engine, a vector image generation engine and a vector display engine. The vector execution engine applies test patterns to the integrated circuit and captures error data being output from the test patterns. The vector image generation engine generates a file of expected output from the application of the test patterns to the integrated circuit. It should be appreciated that the generation of the vector image file occurs offline from the testing by the vector execution engine. The tool also includes a vector display engine allowing identification of vectors including error data. In one embodiment, a timestamp is associated with the vectors of the vector image file and a timestamp is associated with the vectors of the error data. A method for testing an integrated circuit and a graphical user interface are also included.


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