The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2009
Filed:
Apr. 30, 2008
Jeffrey Lee Sonntag, Portland, OR (US);
John Theodore Stonick, Portland, OR (US);
Daniel Keith Weinlader, Allentown, PA (US);
Jeffrey Lee Sonntag, Portland, OR (US);
John Theodore Stonick, Portland, OR (US);
Daniel Keith Weinlader, Allentown, PA (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
An eye opening measurement technique, that does not interrupt a receiver's normal operation, is used as a metric for optimizing any selected parameters of the receiver's operation. If eye opening size decreases, as a result of a change to a receiver parameter, the polarity for stepwise changes is reversed such that the next change is in the opposite direction. Other types of search procedures can be used. Eye opening size is the difference between the eye's upper and lower edges. Measurement of eye opening size is accomplished using a data and auxiliary slicer that find each 'edge' of an eye opening based upon the slicers' level of agreement. Depending upon the level of agreement, and whether symbols of the upper or lower region of the eye are counted, the threshold of the auxiliary slicer can be adjusted in the direction necessary to converge on the eye edge sought.