The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2009
Filed:
Jan. 23, 2007
Min Young Kim, Seoul, KR;
Hee Tae Kim, Gyeonggi-do, KR;
Byung Min Yoo, Gyeonggi-do, KR;
SE Hyun Han, Chungcheongnam-do, KR;
Seung Jun Lee, Seoul, KR;
Min Young Kim, Seoul, KR;
Hee Tae Kim, Gyeonggi-do, KR;
Byung Min Yoo, Gyeonggi-do, KR;
Se Hyun Han, Chungcheongnam-do, KR;
Seung Jun Lee, Seoul, KR;
Koh Young Technology Inc., Seoul, KR;
Abstract
A method of measuring a 3D shape includes the steps of measuring a brightness of a first illumination source, measuring a phase-to-height conversion factor, measuring a 3D shape of a circuit boardaccording to the normal inspection mode, and determining whether bare board information about the circuit boardis included. If the information is not included, performing bare board teaching to acquire the information. Then, the 3D shape of target objects on the circuit boardare measured, when the bare board information is included or bare board teaching information is generated. Next, the circuit boardis analyzed to determine if it is normal or abnormal by using 3D shape information.