The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2009
Filed:
Jan. 18, 2007
Kiyomi Yoshinari, Hitachi, JP;
Yasushi Terui, Tsuchiura, JP;
Toshiyuki Yokosuka, Hitachinaka, JP;
Kinya Kobayashi, Hitachi, JP;
Atsumu Hirabayashi, Kodaira, JP;
Kiyomi Yoshinari, Hitachi, JP;
Yasushi Terui, Tsuchiura, JP;
Toshiyuki Yokosuka, Hitachinaka, JP;
Kinya Kobayashi, Hitachi, JP;
Atsumu Hirabayashi, Kodaira, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
The present invention provides a tandem type mass analysis system capable of carrying out the differential analysis with high efficiency by the tandem type mass analysis. A predetermined number of m/z regions are set up for carrying out the mass analysis with the all ions included therein being dissociated collectively for each m/z region so as to obtain measurement MSdata. By comparing the measurement MSdata with reference MSdata stored in a reference data base, a difference thereof is detected. For the m/z region with a differential component detected, the mass analysis is carried out collectively without dissociation for the all ions included therein so as to obtain measurement MSdata. By comparing the measurement MSdata with the reference MSdata, a difference thereof is detected. From the difference thereof, a parent ion considered to be the differential component factor is presumed for carrying out the mass analysis with the same being dissociated.