The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2009

Filed:

Oct. 13, 2005
Applicants:

Wu-song S. Huang, Poughkeepsie, NY (US);

William H. Heath, Austin, TX (US);

Kaushal S. Patel, Wappingers Falls, NY (US);

Pushkara R. Varanasi, Poughkeepsie, NY (US);

Inventors:

Wu-Song S. Huang, Poughkeepsie, NY (US);

William H. Heath, Austin, TX (US);

Kaushal S. Patel, Wappingers Falls, NY (US);

Pushkara R. Varanasi, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/09 (2006.01);
U.S. Cl.
CPC ...
Abstract

Compositions characterized by the presence of an aqueous base-soluble polymer having aromatic moieties and a refractive index value n of less than 1.5 with respect to a radiation wavelength of 193 nm have been found which are especially useful as top antireflective coatings in 193 nm dry lithographic processes. Polymers with an ethylenic backbone and having fluorine and sulfonic acid moieties have been found to be especially useful. The compositions enable top reflection control at 193 nm while providing ease of use by virtue of their solubility in aqueous alkaline developer solutions.


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