The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Mar. 23, 2007
Masaru Goishi, Tokyo, JP;
Masaru Goishi, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A test apparatus for testing a device under test is provided. The test apparatus includes: a timing data output section for outputting timing data to define at least one of a timing of modifying a test signal provided to the device under test and a timing of acquiring an output signal outputted by the device under test; a variable delay circuit for delaying a reference clock pulse of the test apparatus by a delay amount corresponding to designated delay data so as to generate a timing signal having a transition point corresponding to the at least one timing; and a range modification section for modifying the modification amount of the delay data when the timing data are changed by one unit in response to a change of a setting range within which the at least one timing is set.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile