The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7538890 B1

PDF
Full Text
Expired
Date of Patent:
May. 26, 2009

Filed:

Jun. 06, 2005
Applicants:

Zongtao GE, Saitama, JP;

Takayuki Saito, Saitama, JP;

Minoru Kurose, Saitama, JP;

Inventors:

Zongtao Ge, Saitama, JP;

Takayuki Saito, Saitama, JP;

Minoru Kurose, Saitama, JP;

Assignee:

Fujinon Corporation, Saitama-Shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The light beam measurement apparatus comprises a beam splitter that divides a light beam emitted from a light source unit into two luminous fluxes, a semi-transmitting/reflecting surface that reflects part of one of the divided luminous fluxes back in the opposite direction to the direction of incidence as a sample luminous flux, and reflection-type reference light producing means that converts part of the luminous flux transmitted through the semi-transmitting/reflecting surface into a wavefront-shaped reference luminous flux and outputs this reference luminous flux; this light beam measurement apparatus can carry out both wavefront measurement and light beam spot characteristic measurement on a light beam simultaneously.


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Ge, Zongtao. (2009). Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof (U.S. Patent No. 7538890). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7538890

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