The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2009

Filed:

Aug. 02, 2006
Applicants:

Eugene W. Butler, Corrales, NM (US);

L. John Otten, Iii, Placitas, NM (US);

Gavin R. G. Erry, Albuquerque, NM (US);

Inventors:

Eugene W. Butler, Corrales, NM (US);

L. John Otten, III, Placitas, NM (US);

Gavin R. G. Erry, Albuquerque, NM (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/00 (2006.01); G01J 3/28 (2006.01); G01J 3/45 (2006.01); G01N 21/00 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Determining relationships between one laser beam and an object onto which such beam is directed including: directing such beam onto the object; collecting radiation from the beam that is reflected back; spectrally discriminating the collected, reflected radiation from other collected radiation; generating an image of the collected beam radiation; and analyzing this image to determine the value of at least one parameter selected from: the diameter of the beam on the object; the position of the beam on the object; and beam quality on the object. The determined value(s) may be used to adjust parameter(s) of the beam. Additional steps include directing a second beam onto the object and collecting, spectrally discriminating, generating an image and analyzing it to determine the value of at least one parameter related to the second beam. The forgoing may also include utilizing the determined second value to adjust parameter(s) of the second beam.


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