The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
Dec. 31, 2007
Applicant:
Fang Xu, Newton, MA (US);
Inventor:
Fang Xu, Newton, MA (US);
Assignee:
Teradyne, Inc., North Reading, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
Abstract
A technique for reducing errors in a PTIC (parallel, time-interleaved analog-to-digital converter) consisting of M ADCs involves sampling an input signal with the PTIC and performing M different DFTs, one for each ADC. Elements of the M DFTs are grouped together according to bin number. If all elements corresponding to the same bin number exceed a predetermined threshold, the elements are multiplied by correction matrices to yield corrected, DFT terms for a reconstructed power spectrum. If they do not exceed the threshold, DFT elements are processed to produce uncorrected DFT terms for the reconstructed power spectrum.