The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2009
Filed:
May. 11, 2006
Masako Ishimaru, Kokubunji, JP;
Atsumu Hirabayashi, Kodaira, JP;
Kinya Kobayashi, Hitachi, JP;
Kisaburo Deguchi, Sapporo, JP;
Masako Ishimaru, Kokubunji, JP;
Atsumu Hirabayashi, Kodaira, JP;
Kinya Kobayashi, Hitachi, JP;
Kisaburo Deguchi, Sapporo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An object of the present invention is to provide a mass spectrometry system capable of improving an efficiency of obtaining information on a structure of substances, shortening a time taken for a measurement and substance identification, and improving identification accuracy. The system comprises: a process of mass analyzing an ionized analyte; a first fragmentation process where a first ion is selected from the ions observed in a mass spectrometry to fragment it; a process of mass analyzing a plurality of the ions generated in the first fragmentation process; a process of determining fragment ion combination capable of reconstructing the first ion using a result of the mass spectrometry; a second fragmentation process where the fragment ions contained in the fragment ion combination are fragmented; and a process of mass analyzing the fragment ions generated in the second fragmentation.