The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2009
Filed:
Jun. 28, 2006
Takeyoshi Taguchi, Tachikawa, JP;
Masaru Kuribayashi, Akishima, JP;
Takeyoshi Taguchi, Tachikawa, JP;
Masaru Kuribayashi, Akishima, JP;
Rigaku Corporation, Tokyo, JP;
Abstract
An X-ray diffraction apparatus allows plural kinds of characteristic X-rays to be incident on a sample at the same time and thus allows X-ray diffraction measurement with the plural kinds of characteristic X-rays to be carried out at the same time. An X-ray tube includes an anode which has the first target region made of Co and the second target region made of Cu. The first and second target regions are sectioned in a direction (Z-direction) perpendicular to an X-ray take-off direction. Incident-side and receiving-side Z-direction-divergence restriction devices restrict the X-ray divergence in the Z-direction. An X-ray detector is position sensitive at least in the Z-direction and can detect separately a diffracted X-ray coming from the first sample region which is irradiated with the Co characteristic X-ray and another diffracted X-ray coming from the second sample region which is irradiated with the Cu characteristic X-ray. The detector may be a two-dimensional CCD sensor capable of executing a TDI operation.