The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2009
Filed:
Feb. 10, 2005
Yuichiro Sasaki, Tokyo, JP;
Tamaki Watanabe, Tokyo, JP;
Takeo Kawaguchi, Hyogo, JP;
Shinichi Watanabe, Saitama, JP;
Takeshi Katayama, Tokyo, JP;
Bunji Mizuno, Nara, JP;
Hisataka Kanada, Osaka, JP;
Yuichiro Sasaki, Tokyo, JP;
Tamaki Watanabe, Tokyo, JP;
Takeo Kawaguchi, Hyogo, JP;
Shinichi Watanabe, Saitama, JP;
Takeshi Katayama, Tokyo, JP;
Bunji Mizuno, Nara, JP;
Hisataka Kanada, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
A measuring device includes a magnetic shielding part for shielding an outer magnetic field, and a plurality of magnetic field sensors which are arranged in a shielding space which is formed by the magnetic shielding part, wherein the magnetic field sensor includes a plurality of magnetic field collection mechanisms which collect magnetic fields which the beam current to be measured generates, and the magnetic field collection mechanism is a cylindrical structural body which has at least a surface thereof formed of a superconductive body and includes a bridge portion which has only a portion thereof formed of a superconductive body on an outer peripheral portion thereof, and a magnetic field which the beam current to be measured generates is measured by the magnetic field sensors. Due to the arrangement of the plurality of magnetic field sensors, a beam position and a beam current can be detected.