The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2009
Filed:
Jan. 24, 2007
Makoto Shinohara, Tokyo, JP;
Katsuhito Nagano, Tokyo, JP;
Makoto Shinohara, Tokyo, JP;
Katsuhito Nagano, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
There is provided an analysis apparatusfor analyzing test results of testing, by using a test apparatus, a plurality of devices under test having the same configuration. The analysis apparatusincludes: an acquiring unitthat acquires a judgment result of comparing, to an expected value, a value of data in storage read out for each flip-flop, the data having been stored as a result of scan testing onto flip-flops provided linked to one another by scan chain connection within the devices under test; a result storage unitthat stores the judgment result for each flip-flop in association with a position of the flip-flop in a scan chain; a composite unitthat generates a composite result in which a plurality of judgment results for the devices under test are combined with one another for each position in the scan chain; and a display unitthat displays the composite result.