The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2009
Filed:
Jul. 05, 2006
Applicants:
Kwang-soo Kim, Gyeonggi-do, KR;
Chung-sam Jun, Gyeonggi-do, KR;
Inventors:
Kwang-Soo Kim, Gyeonggi-do, KR;
Chung-Sam Jun, Gyeonggi-do, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of inspecting a substrate is provided comprising applying ultrasonic waves to a substrate, receiving echo pulse signals transmitted through the substrate, and analyzing received echo pulse signals to detect defects in the substrate. Thus, defects in the substrate may be detected.
Kim, Kwang-Soo. (2009). Method of inspecting a substrate using ultrasonic waves and apparatus for performing the same (U.S. Patent No. 7526959). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7526959
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile