The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2009

Filed:

Apr. 03, 2007
Applicant:

Subramanyam Sripada, Hillsboro, OR (US);

Inventor:

Subramanyam Sripada, Hillsboro, OR (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Performing signal integrity (SI) analysis on integrated circuit designs is becoming increasingly important as these designs increase in size and complexity. Dividing a design into blocks can simplify the resulting analysis. Additionally, such blocks can be replaced with timing models, which provide a compact means of exchanging interface timing information for the blocks. To further increase the speed and accuracy of SI analysis, enhanced interface logic models (SI-ILMs) can be used. An SI-ILM can include cells in timing paths that serve as the interface between the block and other parts of the design. The SI-ILM can also include internal nets that have cross-coupling effects on interface nets and nets outside the block. By including these internal nets, SI analysis at the top-level can be both fast and accurate.


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