The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Sep. 10, 2003
Krishnamurthy Bhaskar, San Jose, CA (US);
Mark J. Roulo, Mountain View, CA (US);
Michael Van Riet, Morgan Hill, CA (US);
Stewart K. Hill, San Jose, CA (US);
Krishnamurthy Bhaskar, San Jose, CA (US);
Mark J. Roulo, Mountain View, CA (US);
Michael Van Riet, Morgan Hill, CA (US);
Stewart K. Hill, San Jose, CA (US);
Other;
Abstract
A system for inspecting a substrate. An inspector includes a sensor that inspects the substrate and produces a video stream. A control interface sends and receives a control stream, and a network receives and transports the video stream and the control stream as two separate data streams. A desktop receives the video stream and the control stream as two separate data streams. The desktop has a display that presents the video stream, and a user interface controls that control the operation of the inspector, using the control stream across the network.