The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Jul. 23, 2004
Chie Sato, Musashino, JP;
Shinji Kobayashi, Musashino, JP;
Hirotoshi Kodaka, Musashino, JP;
Ikurou Aoki, Musashino, JP;
Kousuke Doi, Musashino, JP;
Akira Toyama, Musashino, JP;
Morio Wada, Musashino, JP;
Hiroyuki Matsuura, Musashino, JP;
Hiroshi Sugawara, Musashino, JP;
Masamichi Ohashi, Musashino, JP;
Hironori Okita, Musashino, JP;
Yasukazu Akasaka, Musashino, JP;
Tsuyoshi Yakihara, Musashino, JP;
Akira Miura, Musashino, JP;
Chie Sato, Musashino, JP;
Shinji Kobayashi, Musashino, JP;
Hirotoshi Kodaka, Musashino, JP;
Ikurou Aoki, Musashino, JP;
Kousuke Doi, Musashino, JP;
Akira Toyama, Musashino, JP;
Morio Wada, Musashino, JP;
Hiroyuki Matsuura, Musashino, JP;
Hiroshi Sugawara, Musashino, JP;
Masamichi Ohashi, Musashino, JP;
Hironori Okita, Musashino, JP;
Yasukazu Akasaka, Musashino, JP;
Tsuyoshi Yakihara, Musashino, JP;
Akira Miura, Musashino, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
An object of this invention is to realize a pulse pattern generating apparatus that outputs a test signal of high waveform quality even when the shape of an eye pattern is changed. This invention is an improvement of a pulse pattern generating apparatus that generates a test signal of a predetermined pattern by using plural digital-analog converters and outputs the test signal to a test subject. The apparatus includes: a parameter setting unit for setting values of plural parameters that determine the shape of an eye pattern of the test signal; a storage unit for storing output values to the digital-analog converters corresponding to the values of the parameters; an arithmetic operation unit for calculating output values to the digital-analog converters from the values of the parameters from the parameter setting unit and the output values in the storage unit; and a voltage value setting unit for setting, for the digital-analog converters, voltage values to be outputted from the digital-analog converters on the basis of the result of calculation by the arithmetic operation unit.