The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2009

Filed:

Jun. 05, 2006
Applicants:

Martin M. Liphardt, Lincoln, NE (US);

Blaine D. Johs, Lincoln, NE (US);

Craig M. Herzinger, Lincoln, NE (US);

Ping He, Lincoln, NE (US);

Christopher A. Goeden, Lincoln, NE (US);

John A. Woollam, Lincoln, NE (US);

James D. Welch, Omaha, NE (US);

Inventors:

Martin M. Liphardt, Lincoln, NE (US);

Blaine D. Johs, Lincoln, NE (US);

Craig M. Herzinger, Lincoln, NE (US);

Ping He, Lincoln, NE (US);

Christopher A. Goeden, Lincoln, NE (US);

John A. Woollam, Lincoln, NE (US);

James D. Welch, Omaha, NE (US);

Assignee:

J.A. Woollam Co., Inc, Lincoln, NE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are system for and method of analyzing the substantially the exact same point on a sample system with at least two wavelengths, or at least two ranges of wavelengths for which the focal lengths do not vary more than within an acceptable amount.


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