The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2009
Filed:
Sep. 27, 2007
Applicants:
K. Reed Gleason, Portland, OR (US);
Tim Lesher, Portland, OR (US);
Eric W. Strid, Portland, OR (US);
Mike Andrews, Cornelius, OR (US);
John Martin, Portland, OR (US);
John Dunklee, Tigard, OR (US);
Leonard Hayden, Beaverton, OR (US);
Amr M. E. Safwat, Cairo, EG;
Inventors:
K. Reed Gleason, Portland, OR (US);
Tim Lesher, Portland, OR (US);
Eric W. Strid, Portland, OR (US);
Mike Andrews, Cornelius, OR (US);
John Martin, Portland, OR (US);
John Dunklee, Tigard, OR (US);
Leonard Hayden, Beaverton, OR (US);
Amr M. E. Safwat, Cairo, EG;
Assignee:
Cascade Microtech, Inc., Beaverton, OR (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.