The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2009
Filed:
Sep. 27, 2006
Joseph A. Cervantes, Mountain View, CA (US);
Sridhar V. Machiroutu, Fremont, CA (US);
Shawn Mceuen, Portland, OR (US);
Joshua T. Linden-levy, Portland, OR (US);
Robert W. Wolcott, Newberg, OR (US);
Joseph A. Cervantes, Mountain View, CA (US);
Sridhar V. Machiroutu, Fremont, CA (US);
Shawn McEuen, Portland, OR (US);
Joshua T. Linden-Levy, Portland, OR (US);
Robert W. Wolcott, Newberg, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Techniques for precision testing of thermal interface materials are described. An apparatus may include multiple anvils each having multiple sensors disposed along its axis. A thermal interface material may be disposed between the anvils. A control module may be communicatively coupled to said sensors and arranged to receive temperature readings from the multiple sensors to form a temperature gradient, determine a surface temperature for each anvil based on the temperature gradient, determine a heat flux through the thermal interface material based on the surface temperature, and determine a resistance value for the thermal interface material based on the heat flux. Other embodiments are described and claimed.