The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Mar. 07, 2006
Applicant:
Vladimir Kogan, Enschede, NL;
Inventor:
Vladimir Kogan, Enschede, NL;
Assignee:
PANalytical B.V., Almelo, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of correcting for aberrations in scattering data is described which does not require prior knowledge about the sample microstructure properties or calculations based on the modelling of peak locations. In an example, X-ray scattering apparatus integrates a correction device arranged to automatically calculate and output aberration corrected output X-ray pattern using the aberration Fourier presentation F(H,2θ) dependent from the scattering angle 2θ and the Fourier transform of the measured X-ray scattering pattern F(H).