The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
May. 28, 2004
Akihiko Ito, Tokyo, JP;
Kazuyuki Yamashita, Tokyo, JP;
Akihiko Ito, Tokyo, JP;
Kazuyuki Yamashita, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
An electronic device test apparatus for testing IC chips (IC) by pushing their input/output terminals (HB) against contact units of a test head, provided with an IC moving system () for picking up and moving an IC chip (IC) at the front surface where input/output terminals (HB) are led out, a first camera for capturing an image of the front surface of an IC chip (IC) before being picked up, a second camera for capturing an image of a back surface of an IC chip (IC) after being picked up, and an image processing system for calculating the position of input/output terminals (HB) of an IC chip (IC) picked up by the IC moving system () from the image information captured by the first camera and second camera and identifying the relative position of the IC chip (IC) picked up by the IC moving system () with respect to a contact unit based on the results of calculation, wherein the IC moving system () corrects the position of the IC chip based on the relative position of the input/output terminals (HB) of the IC chip (IC) with respect to the contact unit identified by the image processing system.