The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Jun. 10, 2005
Alfred Koelbl, Dachau, DE;
Carl Preston Pixley, Beaverton, OR (US);
Alfred Koelbl, Dachau, DE;
Carl Preston Pixley, Beaverton, OR (US);
Synopsys, Inc, Mountain View, CA (US);
Abstract
An equivalency testing system, for formally comparing an RTLM and HLM, is presented. RTLM and HLM are first converted into DFGs RTLMand HLM. RTLMand HLMare then put into timestep form and are called RTLMand HLM. A test bench CSis selected that couples RTLMand HLM. The combination of RTLM[t], HLM[t] and CS[t] can have parts designated as datapath. Parts designated as datapath can be subject to a form of equivalence checking that seeks to prove equivalence by a form of inductive theorem proving. The theorem proving starts from initial conditions for HLM[t] determined by partial execution of the HLM. CScan be selected depending upon a classification of RTLMand HLM. Techniques for classifying RTLMand HLM, and for selecting a suitable CS, are presented. The classifications can operate on non-DFG representations. The CSgeneration techniques can be used with any formal analysis technique.