The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Oct. 25, 2005
Jonathan M. Hops, Thousand Oaks, CA (US);
Brian G. Swing, Los Gatos, CA (US);
John R. Pane, Tigard, OR (US);
Bruce D. Sudweeks, San Jose, CA (US);
Brian C. Phelps, Simi Valley, CA (US);
James E. Kinslow, Jr., Ben Lomond, CA (US);
Jonathan M. Hops, Thousand Oaks, CA (US);
Brian G. Swing, Los Gatos, CA (US);
John R. Pane, Tigard, OR (US);
Bruce D. Sudweeks, San Jose, CA (US);
Brian C. Phelps, Simi Valley, CA (US);
James E. Kinslow, Jr., Ben Lomond, CA (US);
Teradyne, Inc., Boston, MA (US);
Abstract
A method and system is provided for detecting and correcting non-deterministic data that provides substantially real-time validation results and maximizes flexibility for the device manufacturer while reducing test costs. The automatic test apparatus and method can correct non-determinism caused by cycle slipping at the beginning of data transmission, between packets of data being transmitted and out-of-order data types of non-determinism. A data validation circuit is coupled to the receiver for validating the packet data based on expected packet data stored in a vector memory.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile