The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2009

Filed:

Jan. 31, 2005
Applicants:

Yutaka Kadowaki, Sakai, JP;

Shu Morikawa, Sakai, JP;

Jun Matsumoto, Sakai, JP;

Naoki Kimura, Sakai, JP;

Shinji Yamamoto, Sakai, JP;

Inventors:

Yutaka Kadowaki, Sakai, JP;

Shu Morikawa, Sakai, JP;

Jun Matsumoto, Sakai, JP;

Naoki Kimura, Sakai, JP;

Shinji Yamamoto, Sakai, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

A reflected light measuring apparatus including an illumination system and a light receiving system which receives reflected light from a measuring area of an object illuminated with measuring light projected from the illumination system. The illumination system projects the measuring light with a prescribed angular width onto each point in the measuring area. The illumination system and the light receiving system project the measuring light onto the measuring area and receive the reflected light via a telecentric optical system.


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