The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2009
Filed:
Dec. 12, 2006
Galen L. Pfeiffer, Lincoln, NE (US);
Martin M. Liphardt, Lincoln, NE (US);
Blaine D. Johs, Lincoln, NE (US);
Craig M. Herzinger, Lincoln, NE (US);
Christopher A. Goeden, Lincoln, NE (US);
Ping He, Lincoln, NE (US);
John A. Woollam, Lincoln, NE (US);
James D. Welch, Omaha, NE (US);
Galen L. Pfeiffer, Lincoln, NE (US);
Martin M. Liphardt, Lincoln, NE (US);
Blaine D. Johs, Lincoln, NE (US);
Craig M. Herzinger, Lincoln, NE (US);
Christopher A. Goeden, Lincoln, NE (US);
Ping He, Lincoln, NE (US);
John A. Woollam, Lincoln, NE (US);
James D. Welch, Omaha, NE (US);
J.A. Wooliam Co., Inc., Lincoln, NE (US);
Abstract
System for and Method of analyzing a sample at substantially the exact same small spot thereon with a plurality of wavelengths using a lens system which provides the same focal length at at least two wavelengths at various positions thereof with respect to a sample, including analyzing data obtained at those wavelengths.