The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2009
Filed:
Jun. 27, 2007
Yeong-jar Chang, Hsinchu, TW;
Wen-ching Wu, Hsinchu, TW;
Kun-lun Luo, Hsinchu, TW;
Chia-jen Lee, Hsinchu, TW;
Yeong-Jar Chang, Hsinchu, TW;
Wen-Ching Wu, Hsinchu, TW;
Kun-Lun Luo, Hsinchu, TW;
Chia-Jen Lee, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A wrapper testing circuit of system-on-a-chip for electrical tests of at least a core circuit of an integrated circuit and a wrapper testing method thereof are provided. A controller outputs control signals and test signals and receives result signals executed by the core circuit. The wrapper testing circuit comprises a decoding logic and a plurality of wrapper boundary registers. The decoding logic has a signal decoding table which receives and decodes the control signals and then issues decoded signals according to the signal decoding table. The WBR shifts, updates and captures the test signals for the core circuit to execute and output the result signals according to the decoded signals. In comparison with prior art, the testing time is reduced.