The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2009
Filed:
May. 23, 2006
Partha Gajapathy, McKinney, TX (US);
Todd Dauenbaugh, Richardson, TX (US);
Partha Gajapathy, McKinney, TX (US);
Todd Dauenbaugh, Richardson, TX (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
A memory device includes an ECC and test circuit. In a normal mode, the circuit performs ECC conventional functions. In a test mode, the least significant bit of received data is used to generate test data. If the received bit is '0,' the test data bits are all '0,' and if the received bit is “1,” the test data bits are all “1.” The test data bits are applied to the ECC encoder that is used in normal operation. The ECC encoder is designed so that it generates ECC bits that have the same logic level as the test data bits. The test data bits and ECC bits are then written to a memory array and subsequently read. During the test mode, a logic circuit determines if the read data and check bits are all either “0” or “1” and outputs a corresponding test result bit from the memory device.