The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2009

Filed:

Jul. 10, 2006
Applicants:

Jack Deng, Miaoli County, TW;

Chih-kung Chang, Hsin-Chu, TW;

Chin Chen Kuo, Taipei, TW;

Ming-chang Kao, Taipei County, TW;

Fu-tien Weng, Hsinchu County, TW;

Bii-junq Chang, Hsin-Chu, TW;

Inventors:

Jack Deng, Miaoli County, TW;

Chih-Kung Chang, Hsin-Chu, TW;

Chin Chen Kuo, Taipei, TW;

Ming-Chang Kao, Taipei County, TW;

Fu-Tien Weng, Hsinchu County, TW;

Bii-Junq Chang, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of manufacturing a microlens device by depositing a microlens material layer over a substrate that includes photo-sensors. The microlens material layer is then exposed and developed to define microlens material elements, including first microlens material elements and second microlens material elements. Each second microlens material element is substantially greater in thickness relative to each first microlens material element. The microlens material elements are then heated to form a microlens array that includes first microlens array elements, each corresponding to a first microlens material element, and second microlens array elements, each corresponding to a second microlens material element. Each first microlens array element has a substantially greater focal length relative to each second microlens array element. For example, each second microlens array element is substantially greater in thickness relative to each first microlens array element.


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