The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2009

Filed:

Feb. 22, 2006
Applicants:

Preeti Garg, Sunnyvale, CA (US);

Romi Mayder, San Jose, CA (US);

Mike Augustin, Loveland, CO (US);

Inventors:

Preeti Garg, Sunnyvale, CA (US);

Romi Mayder, San Jose, CA (US);

Mike Augustin, Loveland, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a method includes, providing a test program designed to control a circuit test system. The circuit test system has a plurality of test channels, each test channel of which is configured to be selectively coupled to a plurality of sub-channels under control of the test program. The method further includes 1) analyzing the test program to determine what combinations of channels, sub-channels and timing sets are required by the test program, and 2) in response to this analysis, creating a map of which timing sets, for which combinations of channels and sub-channels, should be pre-loaded into pin electronics that correspond to the test channels.


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