The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2009
Filed:
Jun. 05, 2006
Toshio Kawano, Sakai, JP;
Masayuki Yamada, Toyonaka, JP;
Toshio Kawano, Sakai, JP;
Masayuki Yamada, Toyonaka, JP;
Konica Minolta Sensing, Inc., Sakai-Shi, JP;
Abstract
In three-dimensional measurement where circular polarized light or elliptical polarized light is projected as measurement light, correct measurement results can be obtained irrespective of the difference in intensity between primary reflected light and secondary reflected light. A three-dimensional position measurement method includes projecting, as the measurement light, circular polarized light or elliptical polarized light onto an object to be measured, photoelectrically converting reflected light from the object to obtain a first signal, allowing the reflected light from the object to enter a quarter wavelength plate, allowing reflected light that has passed through the quarter wavelength plate to enter a polarizing device attenuating secondary reflected light that is light reflected from the object twice, photoelectrically converting reflected light that has passed through the polarizing device to obtain a second signal, and removing secondary reflected light components by using a difference between the first signal and the second signal.