The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2009

Filed:

Nov. 17, 2005
Applicants:

Fulong Zhang, Allentown, PA (US);

Harold D. Scholz, Allentown, PA (US);

Inventors:

Fulong Zhang, Allentown, PA (US);

Harold D. Scholz, Allentown, PA (US);

Assignee:

Lattice Semiconductor Corporation, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03H 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

When certain digital circuit devices receive data bus signals, I/O interfaces need to sample the data signals during a time when these signals are both valid and stable. Typically, the data signals are sampled at a time corresponding to a point halfway between rising and falling edges of a reference clock signal associated with the data bus, which sampling time corresponds to a 90-degree phase shift of the reference clock signal. In one embodiment of the invention, a delay count generator determines a delay value corresponding to a quarter cycle (i.e., 90 degrees) of the reference clock signal. In making this determination, a counter counts the number of clock cycles of an internally generated, relatively high-frequency clock signal, where the number corresponds to a specified portion (e.g., one half) of a period of a divided-down version of the reference clock signal. That number can then be used to generate the 90-degree delay value.


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