The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
May. 03, 2007
Wen-yang Chiang, Taipei, TW;
Wen-yih Isaac Tseng, Taipei, TW;
Ming-hwei Perng, Hsinchu, TW;
Other;
Abstract
A q-space sampling method includes: (a) receiving a required sampling number and a range of sampling region in q-space set by a user; (b) obtaining a sampling interval by iteration using a regular non-rectangular sampling lattice when an actual sampling number converges to the required sampling number; and (c) obtaining positions of sampling data in q-space based on the sampling interval and the regular non-rectangular sampling lattice. A diffusion spectrum imaging method using the q-space sampling method is also disclosed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile