The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Nov. 13, 2002
Clarke Daniel Bowers, Baltimore, MD (US);
Tronster Maxwell Hartley, Cockeysville, MD (US);
Kyle Michael Kvech, Baltimore, MD (US);
William Howard Garrison, Cockeysville, MD (US);
Clarke Daniel Bowers, Baltimore, MD (US);
Tronster Maxwell Hartley, Cockeysville, MD (US);
Kyle Michael Kvech, Baltimore, MD (US);
William Howard Garrison, Cockeysville, MD (US);
Prometric inc., Baltimore, MA (US);
Abstract
A memory stores a plurality of first data structures, which includes element specific data objects indicating a classification of at least one of the plurality of segments of the test definition language, and second data structures, which include attribute specific data objects indicating at least one attribute of the segments of the test definition language implemented by a computer. A method for computer-based testing includes authoring a test specification and content of the at least one test using a test definition language, compiling the test specification and content of the at least one test to create a compiled test specification and content, which includes validating the test specification and content, storing the compiled test specification and content to a resource file, and retrieving the compiled test specification and content from the resource file during delivery of the test.