The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2009

Filed:

Mar. 30, 2006
Applicants:

Masaaki Kato, Kariya, JP;

Maiko Futamura, Obu, JP;

Hiroshi Miyagawa, Yokohama, JP;

Inventors:

Masaaki Kato, Kariya, JP;

Maiko Futamura, Obu, JP;

Hiroshi Miyagawa, Yokohama, JP;

Assignees:

Denso Corporation, Kariya, JP;

Toyota Tsusho Corporation, Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/16 (2006.01); G01L 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An endurance testing apparatus, which is for performing an endurance test of a contacting/separating portion in which a first member and a second member repeats contacting with and separating from each other, has a contact load generator and a testing medium fluid supply means. The contact load generator reciprocates the second member relative to the first member to generate a contact load acting between the first member and the second member repeatedly. The testing medium fluid supply means supplies a testing medium fluid to the contacting/separating portion to expose the first member and the second member to the testing medium fluid.


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